Record Beta
ITC - IEEE International Test Conference
https://id.confref.org/data/confident/1723
This record is part of the confref series IEEE International Test Conference.
| rdf:type | cf:Category_Event_Series |
|---|---|
| rdfs:label | ITC - IEEE International Test Conference |
| cf:Academic_Field | https://id.confref.org/data/confident/25896 |
| cf:Acronym | ITC |
| cf:Creation_date | 2022-04-06T19:09:20 |
| cf:DBLP_Series_ID | itc |
| cf:DOI | 10.25798/vxrd-9c65 |
| cf:Display_Title | ITC - IEEE International Test Conference |
| cf:Has_subobject | https://id.confref.org/data/confident/1723/25339a72df59c1403bcd39b6889ae314 |
| cf:Maintainer_Missing | false |
| cf:Modification_date | 2023-04-04T10:18:55 |
| cf:Title | IEEE International Test Conference |
| cf:WikiCFP_Series_ID | 1779&s |
| cf:Wikidata_Series_ID | Q106431226 |
| cf:page | https://www.confident-conference.org/index.php/Event_Series:ITC |
| cf:pageTitle | Event Series:ITC |
| cr:discipline | electrical engineering (wd:Q43035) |
| cr:field | Electrical engineering, electronic engineering, information engineering (https://id.confref.org/data/oecd-fos/2.2) |
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