Record Beta
AST - ACM/IEEE International Conference on Automation of Software Test
https://id.confref.org/data/confident/29961
This record is part of the confref series ACM/IEEE International Conference on Automation of Software Test.
| rdf:type | cf:Category_Event_Series |
|---|---|
| rdfs:label | AST - ACM/IEEE International Conference on Automation of Software Test |
| cf:Acronym | AST |
| cf:Creation_date | 2022-08-24T14:46:40 |
| cf:DBLP_Series_ID | ast |
| cf:Display_Title | AST - ACM/IEEE International Conference on Automation of Software Test |
| cf:Has_subobject | https://id.confref.org/data/confident/29961/25339a72df59c1403bcd39b6889ae314 |
| cf:Has_subobject | https://id.confref.org/data/confident/29961/ed64a0b9be05fc30630286aaaf1fa76f |
| cf:Maintainer_Missing | false |
| cf:Modification_date | 2023-08-30T07:39:48 |
| cf:Recurrence_Period | 1 |
| cf:Recurrence_Unit | year |
| cf:Title | ACM/IEEE International Conference on Automation of Software Test |
| cf:page | https://www.confident-conference.org/index.php/Event_Series:3bbd108e-af98-4059-b0a9-0fdc9f1ece49 |
| cf:pageTitle | Event Series:3bbd108e-af98-4059-b0a9-0fdc9f1ece49 |
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