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Record Beta

NANOARCH 2006

https://id.confref.org/data/confident/33286

This record is part of the confref event IEEE International Workshop on Defect and Fault Tolerant Nanoscale Architectures.

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schema:locationBoston (wd:Q100)
rdfs:labelNANOARCH 2006
cf:Abstract_Deadline2006-03-27
cf:Academic_Fieldhttps://id.confref.org/data/confident/29523
cf:Academic_Fieldhttps://id.confref.org/data/confident/30489
cf:AcronymNANOARCH 2006
cf:Camera-Ready_Deadline2006-05-20
cf:CityBoston
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cf:Country_Missingfalse
cf:Creation_date2022-10-12T11:19:29
cf:Display_TitleNANOARCH 2006
cf:End_Date2006-06-17
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cf:In_Event_Serieshttps://id.confref.org/data/confident/33271
cf:Modification_date2022-10-12T11:19:29
cf:Month6
cf:Notification_Deadline2006-05-01
cf:Official_Websitehttp://nanoarch.ee.duth.gr/06/index.html
cf:Ordinal2
cf:Organizer_Missingtrue
cf:Paper_Deadline2006-04-05
cf:RegionMassachusetts
cf:Single_Day_Eventyes
cf:Start_Date2006-06-17
cf:Start_Date_Missingfalse
cf:TitleIEEE International Workshop on Defect and Fault Tolerant Nanoscale Architectures
cf:Year2006
cf:pagehttps://www.confident-conference.org/index.php/Event:7c882c72-83ae-4a19-8e6d-2a11e700b4f4
cf:pageTitleEvent:7c882c72-83ae-4a19-8e6d-2a11e700b4f4
cr:disciplineemerging technology (wd:Q120208)
cr:disciplinevery-large-scale integration (wd:Q876049)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:fieldEngineering and technology (https://id.confref.org/data/oecd-fos/2)

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