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X-Ray Nanoimaging: Instruments and Methods

https://id.confref.org/data/confident/49506

This record is part of the confref series X-Ray Nanoimaging: Instruments and Methods.

rdf:typecf:Category_Event_Series
rdfs:labelX-Ray Nanoimaging: Instruments and Methods
cf:Academic_Fieldhttps://id.confref.org/data/confident/26007
cf:Academic_Fieldhttps://id.confref.org/data/confident/49480
cf:Creation_date2025-01-15T16:35:18
cf:DOI10.25798/1tcp-sp74
cf:Display_TitleX-Ray Nanoimaging: Instruments and Methods
cf:Has_subobjecthttps://id.confref.org/data/confident/49506/876ecc7e199f491434c95b100b298fc1
cf:Maintainer_Missingfalse
cf:Modification_date2025-01-17T09:13:59
cf:TitleX-Ray Nanoimaging: Instruments and Methods
cf:pagehttps://www.confident-conference.org/index.php/Event_Series:Ad8156ea-640e-42d0-af53-e85552264676
cf:pageTitleEvent Series:Ad8156ea-640e-42d0-af53-e85552264676
cr:disciplinephysics (wd:Q413)
cr:fieldPhysical sciences (https://id.confref.org/data/oecd-fos/1.3)

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