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DBT 2007

https://id.confref.org/data/confident/7575

This record is part of the confref event IEEE International Workshop on Current and Defect Based Testing.

rdf:typecf:Category_Event
schema:locationSanta Clara (wd:Q159260)
rdfs:labelDBT 2007
cf:Abstract_Deadline2007-08-18
cf:Academic_Fieldhttps://id.confref.org/data/confident/25698
cf:AcronymDBT 2007
cf:CitySanta Clara
cf:Countryhttps://id.confref.org/data/confident/31086
cf:Country_Missingfalse
cf:Creation_date2022-04-06T21:36:00
cf:DOI10.25798/f0n3-bh20
cf:Display_TitleDBT 2007
cf:End_Date2007-10-26
cf:Event_Modeon site
cf:Event_Statusas scheduled
cf:Has_Metricfalse
cf:Has_subobjecthttps://id.confref.org/data/confident/7575/2d63049c23582d27d02536ee78d1d47e
cf:Has_subobjecthttps://id.confref.org/data/confident/7575/5d57210b3afe086d873c91fdc14da943
cf:Has_subobjecthttps://id.confref.org/data/confident/7575/bf6fe41c3b63b87a1c48d719c9b4670d
cf:Modification_date2026-09-30T19:51:35
cf:Month10
cf:Official_Websitehttp://dbt.tttc-events.org
cf:Organizer_Missingfalse
cf:RegionCA
cf:Single_Day_Eventno
cf:Start_Date2007-10-25
cf:Start_Date_Missingfalse
cf:Submission_Deadline2007-10-06
cf:TitleIEEE International Workshop on Current and Defect Based Testing
cf:Year2007
cf:pagehttps://www.confident-conference.org/index.php/Event:DBT_2007
cf:pageTitleEvent:DBT 2007
cr:disciplinecomputer science (wd:Q21198)

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