Record Beta
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
https://id.confref.org/data/confref-portal/event/dft2004
This record is part of the confref event 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Cannes (wd:Q39984) |
| rdfs:label | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:acronym | DFT |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Cannes |
| portal:country | France |
| portal:endDate | 2004-10-13 |
| portal:name | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:portalPage | http://portal.confref.org/list/dft2004 |
| portal:series | https://id.confref.org/data/confref-portal/series/dft |
| portal:startDate | 2004-10-10 |
| portal:submissionExtended | false |
| portal:year | 2004 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/dft/dft2004 |
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