Record Beta
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
https://id.confref.org/data/confref-portal/event/dft2012
This record is part of the confref event 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Austin (wd:Q16559) |
| rdfs:label | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:acronym | DFT |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Austin |
| portal:country | USA |
| portal:endDate | 2012-10-05 |
| portal:name | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:portalPage | http://portal.confref.org/list/dft2012 |
| portal:series | https://id.confref.org/data/confref-portal/series/dft |
| portal:startDate | 2012-10-03 |
| portal:submissionExtended | false |
| portal:year | 2012 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | wd:Q106334992 |
| cr:sameAs | https://dblp.org/db/conf/dft/dft2012 |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.