Record Beta
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
https://id.confref.org/data/confref-portal/event/dft2013
This record is part of the confref event 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, USA, October 2-4, 2013.
| rdf:type | portal:Conference |
|---|---|
| schema:location | New York City (wd:Q60) |
| rdfs:label | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:acronym | DFT |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | New York City |
| portal:country | USA |
| portal:endDate | 2013-10-04 |
| portal:name | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:portalPage | http://portal.confref.org/list/dft2013 |
| portal:series | https://id.confref.org/data/confref-portal/series/dft |
| portal:startDate | 2013-10-02 |
| portal:submissionExtended | false |
| portal:year | 2013 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/dft/dft2013 |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.