Record Beta
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
https://id.confref.org/data/confref-portal/event/dft2015
This record is part of the confref event 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Amherst (wd:Q49164) |
| rdfs:label | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:acronym | DFT |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Amherst |
| portal:country | USA |
| portal:endDate | 2015-10-14 |
| portal:name | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:portalPage | http://portal.confref.org/list/dft2015 |
| portal:series | https://id.confref.org/data/confref-portal/series/dft |
| portal:startDate | 2015-10-12 |
| portal:submissionExtended | false |
| portal:year | 2015 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/dft/dft2015 |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.