Record Beta
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
https://id.confref.org/data/confref-portal/event/dft2018
This record is part of the confref event 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Chicago (wd:Q1297) |
| rdfs:label | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:acronym | DFT |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Chicago |
| portal:country | USA |
| portal:endDate | 2018-10-10 |
| portal:name | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:portalPage | http://portal.confref.org/list/dft2018 |
| portal:series | https://id.confref.org/data/confref-portal/series/dft |
| portal:startDate | 2018-10-08 |
| portal:submissionExtended | false |
| portal:year | 2018 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/dft/dft2018 |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.