Record Beta
Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems
https://id.confref.org/data/confref-portal/event/dft2019
This record is part of the confref event 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Kingdom of the Netherlands (wd:Q29999) |
| rdfs:label | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:acronym | DFT |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Noordwijk |
| portal:country | The Netherlands |
| portal:endDate | 2019-10-04 |
| portal:name | Defect and Fault Tolerance in VLSI [and Nanotechnology] Systems |
| portal:portalPage | http://portal.confref.org/list/dft2019 |
| portal:series | https://id.confref.org/data/confref-portal/series/dft |
| portal:startDate | 2019-10-02 |
| portal:submissionExtended | false |
| portal:year | 2019 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/dft/dft2019 |
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