Record Beta
International Conference on Biometrics
https://id.confref.org/data/confref-portal/event/icb2011
This record is part of the confref event 2011 IEEE International Joint Conference on Biometrics, IJCB 2011, Washington, DC, USA, October 11-13, 2011.
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.