Record Beta
International Symposium on Quality Electronic Design
https://id.confref.org/data/confref-portal/event/isqed2017
This record is part of the confref event 18th International Symposium on Quality Electronic Design, ISQED 2017, Santa Clara, CA, USA, March 14-15, 2017.
| rdf:type | portal:Conference |
|---|---|
| schema:location | Santa Clara (wd:Q159260) |
| rdfs:label | International Symposium on Quality Electronic Design |
| portal:acronym | ISQED |
| portal:area | https://id.confref.org/data/confref-portal/area/2 |
| portal:city | Santa Clara |
| portal:country | USA |
| portal:endDate | 2017-03-15 |
| portal:name | International Symposium on Quality Electronic Design |
| portal:portalPage | http://portal.confref.org/list/isqed2017 |
| portal:series | https://id.confref.org/data/confref-portal/series/isqed |
| portal:startDate | 2017-03-14 |
| portal:submissionExtended | false |
| portal:year | 2017 |
| cr:discipline | computer science (wd:Q21198) |
| cr:field | Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2) |
| cr:sameAs | https://dblp.org/db/conf/isqed/isqed2017 |
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