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International Test Conference (ITC)

https://id.confref.org/data/confref-portal/event/itc2006

This record is part of the confref event 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006.

rdf:typeportal:Conference
schema:locationSanta Clara (wd:Q159260)
rdfs:labelInternational Test Conference (ITC)
portal:acronymITC
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:citySanta Clara
portal:countryUSA
portal:endDate2006-10-27
portal:nameInternational Test Conference (ITC)
portal:portalPagehttp://portal.confref.org/list/itc2006
portal:serieshttps://id.confref.org/data/confref-portal/series/itc
portal:startDate2006-10-22
portal:submissionExtendedfalse
portal:year2006
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAswd:Q106431205
cr:sameAshttps://dblp.org/db/conf/itc/itc2006

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