Record Beta

International Test Conference (ITC)

https://id.confref.org/data/confref-portal/event/itc2018

This record is part of the confref event 49th IEEE International Test Conference.

rdf:type	portal:Conference
schema:location	Phoenix (wd:Q16556)
rdfs:label	International Test Conference (ITC)
portal:acronym	ITC
portal:area	https://id.confref.org/data/confref-portal/area/2
portal:city	Phoenix
portal:country	USA
portal:endDate	2018-11-01
portal:keyword	API-call
portal:keyword	ARM
portal:keyword	AVR microcontroller
portal:keyword	Adversarial autoencoder
portal:keyword	Adversarial machine learning
portal:keyword	Anomaly detection
portal:keyword	Applet security
portal:keyword	Autoencoder
portal:keyword	Behavior-based analysis
portal:keyword	Benchmark
portal:keyword	Biometric key generation
portal:keyword	Blockchain
portal:keyword	DSA
portal:keyword	Intrusion detection
portal:keyword	Post-quantum cryptography
portal:keyword	Privacy
portal:keyword	RSA-FDH
portal:keyword	Security
portal:keyword	WROM
portal:keyword	binary analysis
portal:name	International Test Conference (ITC)
portal:portalPage	http://portal.confref.org/list/itc2018
portal:series	https://id.confref.org/data/confref-portal/series/itc
portal:startDate	2018-10-29
portal:submissionExtended	false
portal:year	2018
cr:discipline	computer science (wd:Q21198)
cr:field	Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAs	wd:Q106431192
cr:sameAs	https://dblp.org/db/conf/itc/itc2018
cr:sameAs	https://id.confref.org/data/confident/37074

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