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Memory Technology, Design and Testing

https://id.confref.org/data/confref-portal/event/mtdt2003

This record is part of the confref event 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA.

rdf:typeportal:Conference
schema:locationSan Jose (wd:Q16553)
rdfs:labelMemory Technology, Design and Testing
portal:acronymMTDT
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:citySan José
portal:countryUSA
portal:endDate2003-07-29
portal:nameMemory Technology, Design and Testing
portal:portalPagehttp://portal.confref.org/list/mtdt2003
portal:serieshttps://id.confref.org/data/confref-portal/series/mtdt
portal:startDate2003-07-28
portal:submissionExtendedfalse
portal:year2003
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAshttps://dblp.org/db/conf/mtdt/mtdt2003

Data: Turtle · JSON-LD · N-Triples · RDF/XML

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