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Memory Technology, Design and Testing

https://id.confref.org/data/confref-portal/event/mtdt2004

This record is part of the confref event 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA.

rdf:typeportal:Conference
schema:locationSan Jose (wd:Q16553)
rdfs:labelMemory Technology, Design and Testing
portal:acronymMTDT
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:citySan José
portal:countryUSA
portal:endDate2004-08-10
portal:nameMemory Technology, Design and Testing
portal:portalPagehttp://portal.confref.org/list/mtdt2004
portal:serieshttps://id.confref.org/data/confref-portal/series/mtdt
portal:startDate2004-08-09
portal:submissionExtendedfalse
portal:year2004
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAshttps://dblp.org/db/conf/mtdt/mtdt2004

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