Record Beta
VLSI Design, Automation and Test
https://id.confref.org/data/confref-portal/event/vlsi-dat2013
This record is part of the confref event 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013.
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.