Record Beta

IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip

https://id.confref.org/data/confref-portal/event/vlsi-soc2013

rdf:type	portal:Conference
schema:location	Istanbul (wd:Q406)
rdfs:label	IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip
portal:acronym	VLSI-SoC
portal:area	https://id.confref.org/data/confref-portal/area/2
portal:city	Istanbul
portal:country	Turkey
portal:endDate	2013-10-09
portal:keyword	AES
portal:keyword	ASIC
portal:keyword	Absolute differences
portal:keyword	Active-passive modulator
portal:keyword	Analog circuit testing
portal:keyword	Approximate computing
portal:keyword	Belief Propagation
portal:keyword	Census
portal:keyword	Channel estimation
portal:keyword	Compression
portal:keyword	Consecutive-ones property
portal:keyword	Delta-sigma modulator
portal:keyword	FPGA
portal:keyword	Real-time
portal:keyword	Stereo matching
portal:keyword	Testability
portal:keyword	VLSI
portal:keyword	binary descriptor
portal:keyword	correspondence problem
portal:keyword	expectation maximization
portal:name	IFIP/IEEE International Conference on Very Large Scale Integration - System on a Chip
portal:portalPage	http://portal.confref.org/list/vlsi-soc2013
portal:series	https://id.confref.org/data/confref-portal/series/vlsi-soc
portal:startDate	2013-10-06
portal:submissionExtended	false
portal:year	2013
cr:discipline	computer science (wd:Q21198)
cr:field	Computer and information sciences (https://id.confref.org/data/oecd-fos/1.2)

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