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IEEE VLSI Test Symposium

https://id.confref.org/data/confref-portal/event/vts2001

This record is part of the confref event 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA.

rdf:typeportal:Conference
schema:locationMarina del Rey (wd:Q988140)
rdfs:labelIEEE VLSI Test Symposium
portal:acronymVTS
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityMarina Del Rey
portal:countryUSA
portal:endDate2001-05-03
portal:nameIEEE VLSI Test Symposium
portal:portalPagehttp://portal.confref.org/list/vts2001
portal:serieshttps://id.confref.org/data/confref-portal/series/vts
portal:startDate2001-05-03
portal:submissionExtendedfalse
portal:year2001
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAshttps://dblp.org/db/conf/vts/vts2001

Data: Turtle · JSON-LD · N-Triples · RDF/XML

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