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IEEE VLSI Test Symposium

https://id.confref.org/data/confref-portal/event/vts2015

This record is part of the confref event 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015.

rdf:typeportal:Conference
schema:locationNapa (wd:Q60537)
rdfs:labelIEEE VLSI Test Symposium
portal:acronymVTS
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityNapa
portal:countryUSA
portal:endDate2015-04-29
portal:nameIEEE VLSI Test Symposium
portal:portalPagehttp://portal.confref.org/list/vts2015
portal:serieshttps://id.confref.org/data/confref-portal/series/vts
portal:startDate2015-04-27
portal:submissionExtendedfalse
portal:year2015
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAshttps://dblp.org/db/conf/vts/vts2015

Data: Turtle · JSON-LD · N-Triples · RDF/XML

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