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IEEE VLSI Test Symposium

https://id.confref.org/data/confref-portal/event/vts2016

This record is part of the confref event 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016.

rdf:typeportal:Conference
schema:locationLas Vegas (wd:Q23768)
rdfs:labelIEEE VLSI Test Symposium
portal:acronymVTS
portal:areahttps://id.confref.org/data/confref-portal/area/2
portal:cityLas Vegas
portal:countryUSA
portal:endDate2016-04-27
portal:nameIEEE VLSI Test Symposium
portal:portalPagehttp://portal.confref.org/list/vts2016
portal:serieshttps://id.confref.org/data/confref-portal/series/vts
portal:startDate2016-04-25
portal:submissionExtendedfalse
portal:year2016
cr:disciplinecomputer science (wd:Q21198)
cr:fieldComputer and information sciences (https://id.confref.org/data/oecd-fos/1.2)
cr:sameAswd:Q106335328
cr:sameAshttps://dblp.org/db/conf/vts/vts2016

Data: Turtle · JSON-LD · N-Triples · RDF/XML

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