Record Beta
IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications (BioMS)
https://id.confref.org/data/confref-portal/series/bioms
This record is part of the confref series IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications (BioMS).
| rdf:type | portal:Series |
|---|---|
| rdfs:label | IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications (BioMS) |
| portal:dblpId | https://dblp.org/db/conf/bioms/ |
| portal:name | IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications (BioMS) |
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.