Event Beta
International Symposium on Automated Technology for Verification and Analysis
ATVA
- Date
- 2007-10-22/25
- Place
- Tokyo, Japan on the map
- Series
- International Symposium on Automated Technology for Verification and Analysis
- Edition
- 5
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e100x6n
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| Automated Technology for Verification and Analysis LNCS 4762 | 10.1007/978-3-540-75596-8 | 2007 | Springer |
| Automated Technology for Verification and Analysis, 5th International Symposium, ATVA 2007, Tokyo, Japan, October 22-25, 2007, Proceedings Lecture Notes in Computer Science 4762 | 10.1007/978-3-540-75596-8 | 2007 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| Springer LOD (2018) |
|
|---|---|
| confref portal (2020) | |
| dblp | |
| GND |
Cite
International Symposium on Automated Technology for Verification and Analysis. confref identifier e100x6n. https://id.confref.org/event/e100x6n
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