Event Beta

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems

Name: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Start: 2000-06-19
End: 2000-06-22
Location: New Orleans

IEA/AIE

Date: 2000-06-19/22
Place: New Orleans, United States on the map
Series: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Edition: 13
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e104v2q

Proceedings

Title	DOI	Year	Record
Intelligent Problem Solving, Methodologies and Approaches, 13th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2000, New Orleans, Louisiana, USA, June 19-22, 2000, Proceedings Lecture Notes in Computer Science 1821	10.1007/3-540-45049-1	2000	dblp
Intelligent Problem Solving. Methodologies and Approaches LNCS 1821	10.1007/3-540-45049-1	2000	Springer

Sources

The records of the sources that this identifier brings together (cr:sameAs).

Springer LOD (2018)	`http://lod.springer.com/data/conference/ieaaie2000`
confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ieaaie2000` · page
dblp	`https://dblp.org/db/conf/ieaaie/ieaaie2000`

Cite

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems. confref identifier e104v2q. https://id.confref.org/event/e104v2q

Data: Turtle · JSON-LD · N-Triples · RDF/XML

APIs · SPARQL · About the identifiers

Beta confref labs is under development. Identifiers are stable; pages, data and services can change.