Event Beta

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems

Name: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Start: 2007-06-26
End: 2007-06-29
Location: Kyoto

IEA/AIE

Date: 2007-06-26/29
Place: Kyoto, Japan on the map
Series: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Edition: 20
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e104v99

Proceedings

Title	DOI	Year	Record
New Trends in Applied Artificial Intelligence LNCS 4570	10.1007/978-3-540-73325-6	2007	Springer
New Trends in Applied Artificial Intelligence, 20th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2007, Kyoto, Japan, June 26-29, 2007, Proceedings Lecture Notes in Computer Science 4570	10.1007/978-3-540-73325-6	2007	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

Springer LOD (2018)	`http://lod.springer.com/data/conference/ieaaie2007`
confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ieaaie2007` · page
dblp	`https://dblp.org/db/conf/ieaaie/ieaaie2007`

Cite

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems. confref identifier e104v99. https://id.confref.org/event/e104v99

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