Event Beta

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems

Name: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Start: 2009-06-24
End: 2009-06-27
Location: Tainan

IEA/AIE

Date: 2009-06-24/27
Place: Tainan, Taiwan on the map
Series: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Edition: 22
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e104vb5

Proceedings

Title	DOI	Year	Record
Next-Generation Applied Intelligence LNCS 5579	10.1007/978-3-642-02568-6	2009	Springer
Next-Generation Applied Intelligence, 22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings Lecture Notes in Computer Science 5579	10.1007/978-3-642-02568-6	2009	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

Springer LOD (2018)	`http://lod.springer.com/data/conference/ieaaie2009`
confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ieaaie2009` · page
dblp	`https://dblp.org/db/conf/ieaaie/ieaaie2009`

Cite

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems. confref identifier e104vb5. https://id.confref.org/event/e104vb5

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