Event Beta
International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
IEA/AIE
- Date
- 2011-06-28 to 2011-07-01
- Place
- Syracuse, United States on the map
- Series
- International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
- Edition
- 24
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e104vd1
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| Modern Approaches in Applied Intelligence LNCS 6703 | 10.1007/978-3-642-21822-4 | 2011 | Springer |
| Modern Approaches in Applied Intelligence LNCS 6704 | 10.1007/978-3-642-21827-9 | 2011 | Springer |
| Modern Approaches in Applied Intelligence - 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011, Proceedings, Part I Lecture Notes in Computer Science 6703 | 10.1007/978-3-642-21822-4 | 2011 | dblp |
| Modern Approaches in Applied Intelligence - 24th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011, Proceedings, Part II Lecture Notes in Computer Science 6704 | 10.1007/978-3-642-21827-9 | 2011 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| Springer LOD (2018) |
|
|---|---|
| confref portal (2020) | |
| dblp |
Cite
International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems. confref identifier e104vd1. https://id.confref.org/event/e104vd1
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