Event Beta

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems

Name: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Start: 2013-06-17
End: 2013-06-21
Location: Kingdom of the Netherlands

IEA/AIE

Date: 2013-06-17/21
Place: Kingdom of the Netherlands
Series: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Edition: 26
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e104vfx

Proceedings

Title	DOI	Year	Record
Recent Trends in Applied Artificial Intelligence LNCS 7906	10.1007/978-3-642-38577-3	2013	Springer
Recent Trends in Applied Artificial Intelligence, 26th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2013, Amsterdam, The Netherlands, June 17-21, 2013. Proceedings Lecture Notes in Computer Science 7906	10.1007/978-3-642-38577-3	2013	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

Springer LOD (2018)	`http://lod.springer.com/data/conference/ieaaie2013`
confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ieaaie2013` · page
dblp	`https://dblp.org/db/conf/ieaaie/ieaaie2013`

Cite

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems. confref identifier e104vfx. https://id.confref.org/event/e104vfx

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