Event Beta

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems

Name: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Start: 2015-06-10
End: 2015-06-12
Location: Seoul

IEA/AIE

Date: 2015-06-10/12
Place: Seoul, South Korea on the map
Series: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Edition: 28
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e104vhr

Proceedings

Title	DOI	Year	Record
Current Approaches in Applied Artificial Intelligence LNCS 9101	10.1007/978-3-319-19066-2	2015	Springer
Current Approaches in Applied Artificial Intelligence - 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, Seoul, South Korea, June 10-12, 2015, Proceedings Lecture Notes in Computer Science 9101	10.1007/978-3-319-19066-2	2015	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

Springer LOD (2018)	`http://lod.springer.com/data/conference/ieaaie2015`
confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ieaaie2015` · page
dblp	`https://dblp.org/db/conf/ieaaie/ieaaie2015`

Cite

International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems. confref identifier e104vhr. https://id.confref.org/event/e104vhr

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