Event Beta
International Embedded Systems Symposium
IESS
- Date
- 2013-06-17/19
- Place
- Paderborn, Germany on the map
- Series
- International Embedded Systems Symposium
- Edition
- 4
- Academic field
- Natural sciences: Computer and information sciences
- Disciplines
- computer science
- Identifier
https://id.confref.org/event/e104vt6
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| Embedded Systems: Design, Analysis and Verification IFIP-AICT 403 | 10.1007/978-3-642-38853-8 | 2013 | Springer |
| Embedded Systems: Design, Analysis and Verification - 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 17-19, 2013. Proceedings IFIP Advances in Information and Communication Technology 403 | 10.1007/978-3-642-38853-8 | 2013 | dblp |
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| Springer LOD (2018) |
|
|---|---|
| confref portal (2020) | |
| dblp |
Cite
International Embedded Systems Symposium. confref identifier e104vt6. https://id.confref.org/event/e104vt6
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