Event Beta

35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017

Name: 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017
Start: 2017-04-09
End: 2017-04-12
Location: Las Vegas

VTS 2017VTS

Date: 2017-04-09/12
Place: Las Vegas, United States on the map
Series: IEEE VLSI Test Symposium (VTS)
Edition: 35
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, test, very-large-scale integration
Identifier: https://id.confref.org/event/e10ebr6

Proceedings

Title	DOI	Year	Record
35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017		2017	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vts2017` · page
Wikidata	`http://www.wikidata.org/entity/Q106243841`
dblp	`https://dblp.org/db/conf/vts/vts2017`
GND	`https://d-nb.info/gnd/1139216651`

Cite

35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. confref identifier e10ebr6. https://id.confref.org/event/e10ebr6

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