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VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Name: VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Start: 2018-06-28
End: 2018-06-30
Location: Madurai

VDAT 2018VDAT

Date: 2018-06-28/30
Place: Madurai, India on the map
Series: International Symposium on VLSI Design and Test (VDAT)
Edition: 22
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, test, very-large-scale integration
Identifier: https://id.confref.org/event/e10et08

Proceedings

Title	DOI	Year	Record
VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers Communications in Computer and Information Science 892	10.1007/978-981-13-5950-7	2019	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vdat2018` · page
Wikidata	`http://www.wikidata.org/entity/Q106245327`
dblp	`https://dblp.org/db/conf/vdat/vdat2018`
GND	`https://d-nb.info/gnd/1180076052`

Cite

VLSI Design and Test - 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. confref identifier e10et08. https://id.confref.org/event/e10et08

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