Event Beta

VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers

Name: VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Start: 2017-06-29
End: 2017-07-02
Location: Roorkee

VDAT 2017VDAT

Date: 2017-06-29 to 2017-07-02
Place: Roorkee, India on the map
Series: International Symposium on VLSI Design and Test (VDAT)
Edition: 21
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, test, very-large-scale integration
Identifier: https://id.confref.org/event/e10et16

Proceedings

Title	DOI	Year	Record
VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers Communications in Computer and Information Science 711	10.1007/978-981-10-7470-7	2017	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vdat2017` · page
Wikidata	`http://www.wikidata.org/entity/Q106245328`
dblp	`https://dblp.org/db/conf/vdat/vdat2017`
GND	`https://d-nb.info/gnd/1152034650`

Cite

VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. confref identifier e10et16. https://id.confref.org/event/e10et16

Data: Turtle · JSON-LD · N-Triples · RDF/XML

APIs · SPARQL · About the identifiers

Beta confref labs is under development. Identifiers are stable; pages, data and services can change.