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VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers

Name: VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
Start: 2013-07-27
End: 2013-07-30
Location: Jaipur

VDAT 2013VDAT

Date: 2013-07-27/30
Place: Jaipur, India on the map
Series: International Symposium on VLSI Design and Test (VDAT)
Edition: 17
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, test, very-large-scale integration
Identifier: https://id.confref.org/event/e10et24

Proceedings

Title	DOI	Year	Record
VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers Communications in Computer and Information Science 382	10.1007/978-3-642-42024-5	2013	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/vdat2013` · page
Wikidata	`http://www.wikidata.org/entity/Q106245329`
dblp	`https://dblp.org/db/conf/vdat/vdat2013`
GND	`https://d-nb.info/gnd/1046996479`

Cite

VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers. confref identifier e10et24. https://id.confref.org/event/e10et24

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