Event Beta

17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008

Name: 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008
Start: 2008-11-24
End: 2008-11-27
Location: Sapporo

ATSAsian Test Symposium 2008

Date: 2008-11-24/27
Place: Sapporo, Japan on the map
Series: Asian Test Symposium (ATS)
Edition: 17
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10ffxp

Proceedings

Title	DOI	Year	Record
17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008		2008	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/ats2008` · page
Wikidata	`http://www.wikidata.org/entity/Q106330807`
dblp	`https://dblp.org/db/conf/ats/ats2008`

Cite

17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. confref identifier e10ffxp. https://id.confref.org/event/e10ffxp

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