Event Beta

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014

Name: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014
Start: 2014-10-01
End: 2014-10-03
Location: Amsterdam

DFT 2014DFT

Date: 2014-10-01/03
Place: Amsterdam, Netherlands on the map
Series: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, very-large-scale integration
Identifier: https://id.confref.org/event/e10g4zt

Proceedings

Title	DOI	Year	Record
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014		2014	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/dft2014` · page
Wikidata	`http://www.wikidata.org/entity/Q106334991`
dblp	`https://dblp.org/db/conf/dft/dft2014`

Cite

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. confref identifier e10g4zt. https://id.confref.org/event/e10g4zt

Data: Turtle · JSON-LD · N-Triples · RDF/XML

APIs · SPARQL · About the identifiers

Beta confref labs is under development. Identifiers are stable; pages, data and services can change.