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24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009

Name: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009
Start: 2009-10-07
End: 2009-10-09
Location: Chicago

DFT 2009DFT

Date: 2009-10-07/09
Place: Chicago, United States on the map
Series: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Edition: 24
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, very-large-scale integration
Identifier: https://id.confref.org/event/e10g51p

Proceedings

Title	DOI	Year	Record
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009		2009	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/dft2009` · page
Wikidata	`http://www.wikidata.org/entity/Q106334993`
dblp	`https://dblp.org/db/conf/dft/dft2009`

Cite

24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009. confref identifier e10g51p. https://id.confref.org/event/e10g51p

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