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1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996

Name: 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996
Start: 1996-11-06
End: 1996-11-08
Location: Boston

DFT 1996DFT

Date: 1996-11-06/08
Place: Boston, United States on the map
Series: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science, very-large-scale integration
Identifier: https://id.confref.org/event/e10g52m

Proceedings

Title	DOI	Year	Record
1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996		1996	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/dft1996` · page
Wikidata	`http://www.wikidata.org/entity/Q106334994`
dblp	`https://dblp.org/db/conf/dft/dft1996`

Cite

1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. confref identifier e10g52m. https://id.confref.org/event/e10g52m

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