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VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

Name: VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Start: 2019-07-04
End: 2019-07-06
Location: Indore

VDAT 2019

Date: 2019-07-04/06
Place: Indore, India on the map
Series: International Symposium on VLSI Design and Test (VDAT)
Edition: 23
Academic field: Natural sciences: Computer and information sciences
Disciplines: very-large-scale integration
Identifier: https://id.confref.org/event/e10hdvq

Proceedings

Title	DOI	Year	Record
VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers Communications in Computer and Information Science 1066	10.1007/978-981-32-9767-8	2019	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

Wikidata	`http://www.wikidata.org/entity/Q106338115`
dblp	`https://dblp.org/db/conf/vdat/vdat2019`

Cite

VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. confref identifier e10hdvq. https://id.confref.org/event/e10hdvq

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