Event Beta

International Conference on Measurement and Modeling of Computer Systems

Name: International Conference on Measurement and Modeling of Computer Systems
Start: 2017-06-05
End: 2017-06-09
Location: Urbana

SIGMETRICS 2017SIGMETRICS

Date: 2017-06-05/09
Place: Urbana, United States on the map
Series: International Conference on Measurement and Modeling of Computer Systems
Attendance: on site
Status: as scheduled
Website: https://www.sigmetrics.org/sigmetrics2017/
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hhj5

Proceedings

Title	DOI	Year	Record
Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, Urbana-Champaign, IL, USA, June 05 - 09, 2017	10.1145/3078505	2017	dblp

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/sigmetrics2017` · page
ConfIDent	`https://id.confref.org/data/confident/34284` · page
Wikidata	`http://www.wikidata.org/entity/Q106338799`
dblp	`https://dblp.org/db/conf/sigmetrics/sigmetrics2017`

International Conference on Measurement and Modeling of Computer Systems. confref identifier e10hhj5. https://id.confref.org/event/e10hhj5

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