Event Beta
50th
ITC 2019
- Date
- 2019-11-12/14
- Place
- Washington, D.C., United States on the map
- Series
- International Test Conference, International Test Conference (ITC), IEEE International Test Conference
- Attendance
- on site
- Status
- as scheduled
- Academic field
- Natural sciences: Computer and information sciences
Engineering and technology: Electrical engineering, electronic engineering, information engineering - Disciplines
- electrical engineering
- Identifier
https://id.confref.org/event/e10hygw
Proceedings
| Title | DOI | Year | Record |
|---|---|---|---|
| IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019 | 2019 | dblp |
Where the sources disagree
- start date: confident: 2019-11-12; wikidata: 2019-11-09
The facts above are taken from the source first in precedence (ConfIDent, Springer, dblp, Wikidata, the portal, the GND).
Sources
The records of the sources that this identifier brings together (cr:sameAs).
| ConfIDent | |
|---|---|
| Wikidata | |
| dblp | |
| GND |
Cite
50th. confref identifier e10hygw. https://id.confref.org/event/e10hygw
Beta confref labs is under development. Identifiers are stable; pages, data and services can change.