# https://id.confref.org/event/e10hyjr (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e10hyjr>
    a cr:Event ;
    schema:alternateName "ITC 2017" ,
        "ITC" ;
    schema:endDate "2017-11-02"^^xsd:date ;
    schema:eventAttendanceMode schema:OfflineEventAttendanceMode ;
    schema:eventStatus schema:EventScheduled ;
    schema:location wd:Q16558 ;
    schema:name "48th IEEE International Test Conference" ;
    schema:startDate "2017-10-30"^^xsd:date ;
    rdfs:label "48th IEEE International Test Conference" ;
    cr:discipline wd:Q21198 ,
        wd:Q43035 ;
    cr:field <https://id.confref.org/data/oecd-fos/1.2> ,
        <https://id.confref.org/data/oecd-fos/2.2> ;
    cr:inSeries <https://id.confref.org/series/s10b0nx> ,
        <https://id.confref.org/series/s122qw8> ,
        <https://id.confref.org/series/s126kht> ,
        <https://id.confref.org/series/s12q029> ;
    cr:proceedings <https://dblp.org/rec/conf/itc/2017> ;
    cr:sameAs <https://d-nb.info/gnd/1161555056> ,
        <https://dblp.org/db/conf/itc/itc2017> ,
        <https://id.confref.org/data/confident/37075> ,
        <https://id.confref.org/data/confref-portal/event/itc2017> ,
        wd:Q106431193 ;
    cr:year "2017"^^xsd:gYear .