Event Beta

2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016

Name: 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016
Start: 2016-11-15
End: 2016-11-17
Location: Fort Worth

ITC 2016ITC

Date: 2016-11-15/17
Place: Fort Worth, United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hykp

Proceedings

Title	DOI	Year	Record
2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016		2016	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc2016` · page
Wikidata	`http://www.wikidata.org/entity/Q106431194`
dblp	`https://dblp.org/db/conf/itc/itc2016`
GND	`https://d-nb.info/gnd/1131291506`

Cite

2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. confref identifier e10hykp. https://id.confref.org/event/e10hykp

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