Event Beta

2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007

Name: 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007
Start: 2007-10-21
End: 2007-10-26
Location: Santa Clara

ITC 2007ITC

Date: 2007-10-21/26
Place: Santa Clara, United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hyw4

Proceedings

Title	DOI	Year	Record
2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007		2007	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc2007` · page
Wikidata	`http://www.wikidata.org/entity/Q106431204`
dblp	`https://dblp.org/db/conf/itc/itc2007`

Cite

2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. confref identifier e10hyw4. https://id.confref.org/event/e10hyw4

Data: Turtle · JSON-LD · N-Triples · RDF/XML

APIs · SPARQL · About the identifiers

Beta confref labs is under development. Identifiers are stable; pages, data and services can change.