Event Beta

Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005

Name: Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005
Start: 2005-11-08
End: 2005-11-10
Location: Austin

ITC 2005ITC

Date: 2005-11-08/10
Place: Austin, United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hyy0

Proceedings

Title	DOI	Year	Record
Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005		2005	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc2005` · page
Wikidata	`http://www.wikidata.org/entity/Q106431206`
dblp	`https://dblp.org/db/conf/itc/itc2005`
GND	`https://d-nb.info/gnd/6053662-7`

Cite

Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. confref identifier e10hyy0. https://id.confref.org/event/e10hyy0

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