Event Beta

Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997

Name: Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997
Start: 1997-11-03
End: 1997-11-05
Location: Washington, D.C.

ITC 1997ITC

Date: 1997-11-03/05
Place: Washington, D.C., United States on the map
Series: International Test Conference, International Test Conference (ITC), International Test Conference (ITC)
Academic field: Natural sciences: Computer and information sciences
Disciplines: computer science
Identifier: https://id.confref.org/event/e10hz6g

Proceedings

Title	DOI	Year	Record
Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997		1997	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

confref portal (2020)	`https://id.confref.org/data/confref-portal/event/itc1997` · page
Wikidata	`http://www.wikidata.org/entity/Q106431218`
dblp	`https://dblp.org/db/conf/itc/itc1997`
GND	`https://d-nb.info/gnd/1901391-7`

Cite

Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. confref identifier e10hz6g. https://id.confref.org/event/e10hz6g

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