# https://id.confref.org/event/e10hz7e (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e10hz7e>
    a cr:Event ;
    schema:alternateName "ITC 1996" ,
        "ITC" ;
    schema:endDate "1996-10-25"^^xsd:date ;
    schema:location wd:Q61 ;
    schema:name "Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996" ;
    schema:startDate "1996-10-20"^^xsd:date ;
    rdfs:label "Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996" ;
    cr:discipline wd:Q21198 ;
    cr:field <https://id.confref.org/data/oecd-fos/1.2> ;
    cr:inSeries <https://id.confref.org/series/s10b0nx> ,
        <https://id.confref.org/series/s122qw8> ,
        <https://id.confref.org/series/s12q029> ;
    cr:proceedings <https://dblp.org/rec/conf/itc/1996> ;
    cr:sameAs <https://d-nb.info/gnd/5244583-5> ,
        <https://dblp.org/db/conf/itc/itc1996> ,
        <https://id.confref.org/data/confref-portal/event/itc1996> ,
        wd:Q106431219 ;
    cr:year "1996"^^xsd:gYear .