# https://id.confref.org/event/e10hzb6 (confref labs, beta)
@prefix cr: <https://id.confref.org/ontology/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://id.confref.org/event/e10hzb6>
    a cr:Event ;
    schema:alternateName "ITC 1992" ,
        "ITC" ;
    schema:endDate "1992-09-24"^^xsd:date ;
    schema:location wd:Q5092 ;
    schema:name "Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992" ;
    schema:startDate "1992-09-20"^^xsd:date ;
    rdfs:label "Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992" ;
    cr:discipline wd:Q21198 ;
    cr:field <https://id.confref.org/data/oecd-fos/1.2> ;
    cr:inSeries <https://id.confref.org/series/s10b0nx> ,
        <https://id.confref.org/series/s122qw8> ,
        <https://id.confref.org/series/s12q029> ;
    cr:proceedings <https://dblp.org/rec/conf/itc/1992> ;
    cr:sameAs <https://d-nb.info/gnd/5076816-5> ,
        <https://dblp.org/db/conf/itc/itc1992> ,
        <https://id.confref.org/data/confref-portal/event/itc1992> ,
        wd:Q106431223 ;
    cr:year "1992"^^xsd:gYear .