Event Beta

IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022

Name: IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022
Location: Newark

Date: 2022
Place: Newark, United States on the map
Series: International Conference on Artificial Intelligence Testing (AITest)
Academic field: Natural sciences: Computer and information sciences
Identifier: https://id.confref.org/event/e10qd2y

Proceedings

Title	DOI	Year	Record
IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022	10.1109/aitest55621.2022	2022	dblp

Sources

The records of the sources that this identifier brings together (cr:sameAs).

dblp	`https://dblp.org/db/conf/aitest/aitest2022`

Cite

IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022. confref identifier e10qd2y. https://id.confref.org/event/e10qd2y

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